Search Results - V. Hsieh

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  1. 1

    Analytical Tools to Improve Optimization Procedures for Lateral Flow Assays by Helen V. Hsieh, Jeffrey L. Dantzler, Bernhard H. Weigl

    Published in Diagnostics (2017-05-01)
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  2. 2

    Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes by M. F. DiScala, V. Hsieh, B. S. Jessen, Y. Gu, D. J. Rizzo, J. M. Amontree, X. Yan, Q. Wang, M. Kapfer, T. Kim, M. Geiwitz, G. Natale, J. Pelliciari, J. C. Hone, K. S. Burch, D. N. Basov, C. R. Dean, V. Bisogni, K. W. Plumb

    Published in Frontiers in Electronic Materials (2025-06-01)
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