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Low Interface Trapped Charge Density for AlO/β-GaO (001) Metal-Insulator-Semiconductor Capacitor<sub/><sub/><sub/><sub/> by Qihao Zhang, Yisong Shen, Jiangwei Liu, Chunming Tu, Dongyuan Zhai, Min He, Jiwu Lu
Published in IEEE Journal of the Electron Devices Society (2022-01-01)Get full text
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