Geng, J., Yang, J., Shu, T., Cheng, X., & Chen, R. (2023, March). Stability of breakdown phenomenon in N2, SF6, and their mixture under impulse voltages. AIP Advances.
Chicago Style (17th ed.) CitationGeng, Jiuyuan, Jianhua Yang, Ting Shu, Xinbing Cheng, and Rong Chen. "Stability of Breakdown Phenomenon in N2, SF6, and Their Mixture Under Impulse Voltages." AIP Advances Mar. 2023.
MLA (9th ed.) CitationGeng, Jiuyuan, et al. "Stability of Breakdown Phenomenon in N2, SF6, and Their Mixture Under Impulse Voltages." AIP Advances, Mar. 2023.
Warning: These citations may not always be 100% accurate.
