Development of Residual Dense U-Net (RDU-Net)-Based Metal Artefacts Reduction Technique Using Spectral Photon Counting CT

Metal induced artefacts in computed tomography (CT) images are primarily caused by beam hardening, scatter effects, and photon starvation. These artefacts impede the characterization of fine anatomical structures and compromise the diagnostic value of the CT images. We aim to develop an innovative m...

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書誌詳細

出版年:	IEEE Access
主要な著者:	Osama Khan, Briya Tariq, Nadine Francis, Nabil Maalej, Abderaouf Behouch, Amer Kashif, Asim Waris, Aamir Raja
フォーマット:	論文
言語:	英語
出版事項:	IEEE 2024-01-01
主題:	Computed tomography (CT) metal artefacts reduction (MAR) spectral photon-counting CT (SPCCT)
オンライン･アクセス:	https://ieeexplore.ieee.org/document/10630472/