Polarized Raman Study of First-Order Phonons in Self-Flux Grown Single-Crystalline WTe<sub>2</sub>

Bulk single crystals of WTe<sub>2</sub> were grown by the self-flux method and characterized by X-ray diffraction, polarized micro-Raman spectroscopy, and optical microscopy. All methods revealed a high crystalline quality, thus demonstrating the advantages of the growth method used as a...

وصف كامل

التفاصيل البيبلوغرافية
الحاوية / القاعدة:	Nanomaterials
المؤلفون الرئيسيون:	Peter M. Rafailov, Dimitre Dimitrov, Daniela Kovacheva, Vera Marinova
التنسيق:	مقال
اللغة:	الإنجليزية
منشور في:	MDPI AG 2024-07-01
الموضوعات:	tungsten ditelluride polarized Raman spectroscopy XRD phonons self-flux crystal growth
الوصول للمادة أونلاين:	https://www.mdpi.com/2079-4991/14/15/1256

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