Pilipenko, U. A., Kovalchuk, N. S., Shestovski, D. V., & Zhyhulin, D. V. (2024, July). Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface after Exposure with Long-Term and Rapid Thermal Annealing. Приборы и методы измерений.
Chicago Style (17th ed.) CitationPilipenko, U. A., N. S. Kovalchuk, D. V. Shestovski, and D. V. Zhyhulin. "Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface After Exposure with Long-Term and Rapid Thermal Annealing." Приборы и методы измерений Jul. 2024.
MLA (9th ed.) CitationPilipenko, U. A., et al. "Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface After Exposure with Long-Term and Rapid Thermal Annealing." Приборы и методы измерений, Jul. 2024.
