Analysis and Mitigation of Negative Differential Resistance Effects with Hetero-gate Dielectric Layer in Negative-capacitance Field-effect Transistors

Bibliographic Details
Published in:Informacije MIDEM
Main Authors: H. Huo, W. Lü, X. Zheng, Y. Wang, S. Zhao
Format: Article
Language:English
Published: MIDEM Society - Society for Microelectronics, Electronic Components and Materials 2024-04-01
Online Access:http://www.midem-drustvo.si/Journal%20papers/MIDEM_54(2024)1p6.pdf
Description
ISSN:0352-9045
2232-6979

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