Automatic Cephalometric Landmark Detection on X-ray Images Using a Deep-Learning Method

Accurate automatic quantitative cephalometry are essential for orthodontics. However, manual labeling of cephalometric landmarks is tedious and subjective, which also must be performed by professional doctors. In recent years, deep learning has gained attention for its success in computer vision fie...

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Bibliographic Details
Published in:	Applied Sciences
Main Authors:	Yu Song, Xu Qiao, Yutaro Iwamoto, Yen-wei Chen
Format:	Article
Language:	English
Published:	MDPI AG 2020-04-01
Subjects:	cephalometric landmark X-ray deep learning ResNet registration
Online Access:	https://www.mdpi.com/2076-3417/10/7/2547

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