توثيق جمعية علم النفس الأمريكية APA (الطبعة السابعة)

Kobayashi, T., Fujimoto, H., Kamihata, S., Hachiken, K., Hara, M., & Watanabe, H. (2025, January). Performance and reliability improvements in SiC(0001) MOS devices via two-step annealing in H2/Ar gas mixtures. Applied Physics Express.

توثيق أسلوب شيكاغو (الطبعة السابعة عشر)

Kobayashi, Takuma, Hiroki Fujimoto, Shinji Kamihata, Keiji Hachiken, Masahiro Hara, و Heiji Watanabe. "Performance and Reliability Improvements in SiC(0001) MOS Devices via Two-step Annealing in H2/Ar Gas Mixtures." Applied Physics Express Jan. 2025.

توثيق جمعية اللغة المعاصرة MLA (الإصدار التاسع)

Kobayashi, Takuma, et al. "Performance and Reliability Improvements in SiC(0001) MOS Devices via Two-step Annealing in H2/Ar Gas Mixtures." Applied Physics Express, Jan. 2025.