Wenye, L., Yanyong, L., Jinfeng, Y., Hongfeng, W., & Liping, W. (2016, January). Research on Application Reliability of IGBT Device in Non-standard Operating Conditions. Kongzhi Yu Xinxi Jishu.
Chicago Style (17th ed.) CitationWenye, LIU, LI Yanyong, YANG Jinfeng, WANG Hongfeng, and WANG Liping. "Research on Application Reliability of IGBT Device in Non-standard Operating Conditions." Kongzhi Yu Xinxi Jishu Jan. 2016.
MLA (9th ed.) CitationWenye, LIU, et al. "Research on Application Reliability of IGBT Device in Non-standard Operating Conditions." Kongzhi Yu Xinxi Jishu, Jan. 2016.
Warning: These citations may not always be 100% accurate.
