APA (7th ed.) Citation

Chen, P., Miao, W., Ahmed, T., Pan, Y., Lin, C., Chen, S., . . . Lien, D. (2022, March). Defect Inspection Techniques in SiC. Nanoscale Research Letters.

Chicago Style (17th ed.) Citation

Chen, Po-Chih, Wen-Chien Miao, Tanveer Ahmed, Yi-Yu Pan, Chun-Liang Lin, Shih-Chen Chen, Hao-Chung Kuo, Bing-Yue Tsui, and Der-Hsien Lien. "Defect Inspection Techniques in SiC." Nanoscale Research Letters Mar. 2022.

MLA (9th ed.) Citation

Chen, Po-Chih, et al. "Defect Inspection Techniques in SiC." Nanoscale Research Letters, Mar. 2022.