Critical modeling issues of SiGe semiconductor devices

We present the state-of-the-art in simulation of silicon-germanium (SiGe) semiconductor devices. The work includes a detailed comparison of device simulators and current transport models. Among the critical modeling issues addressed in the paper, special attention is focused on the description of t...

詳細記述

書誌詳細
出版年:Journal of Telecommunications and Information Technology
主要な著者: Vassil Palankovski, Siegfried Selberherr
フォーマット: 論文
言語:英語
出版事項: National Institute of Telecommunications 2004-03-01
主題:
オンライン・アクセス:https://jtit.pl/jtit/article/view/233

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