Critical modeling issues of SiGe semiconductor devices
We present the state-of-the-art in simulation of silicon-germanium (SiGe) semiconductor devices. The work includes a detailed comparison of device simulators and current transport models. Among the critical modeling issues addressed in the paper, special attention is focused on the description of t...
| 出版年: | Journal of Telecommunications and Information Technology |
|---|---|
| 主要な著者: | Vassil Palankovski, Siegfried Selberherr |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
National Institute of Telecommunications
2004-03-01
|
| 主題: | |
| オンライン・アクセス: | https://jtit.pl/jtit/article/view/233 |
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