APA (7th ed.) Citation

Kiene, G., Ilik, S., Mastrodomenico, L., Babaie, M., & Sebastiano, F. (2024, January). Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS. IEEE Journal of the Electron Devices Society.

Chicago Style (17th ed.) Citation

Kiene, Gerd, Sadik Ilik, Luigi Mastrodomenico, Masoud Babaie, and Fabio Sebastiano. "Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS." IEEE Journal of the Electron Devices Society Jan. 2024.

MLA (9th ed.) Citation

Kiene, Gerd, et al. "Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS." IEEE Journal of the Electron Devices Society, Jan. 2024.