APA (7th ed.) Citation

Ma, X., Xiong, R., Wang, W., & Zhang, X. (2023, November). Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy. Sensors.

Chicago Style (17th ed.) Citation

Ma, Xinyang, Rui Xiong, Wei Wang, and Xiangchao Zhang. "Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy." Sensors Nov. 2023.

MLA (9th ed.) Citation

Ma, Xinyang, et al. "Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy." Sensors, Nov. 2023.