APA (7th ed.) Citation

Wang, S., Kong, Z., Zhao, J., Guan, S., Zhao, R., Ju, A., . . . Lian, P. (2025, August). Dopant Diffusion‐Induced Dielectric Breakdown: Stacked Dielectric Reliability on Heavily Doped Polysilicon. Advanced Electronic Materials.

Chicago Style (17th ed.) Citation

Wang, Shuo, Zebin Kong, Jie Zhao, Shukai Guan, Ranran Zhao, Anan Ju, Kunshu Wang, and Pengfei Lian. "Dopant Diffusion‐Induced Dielectric Breakdown: Stacked Dielectric Reliability on Heavily Doped Polysilicon." Advanced Electronic Materials Aug. 2025.

MLA (9th ed.) Citation

Wang, Shuo, et al. "Dopant Diffusion‐Induced Dielectric Breakdown: Stacked Dielectric Reliability on Heavily Doped Polysilicon." Advanced Electronic Materials, Aug. 2025.