APA (7th ed.) Citation

Li, M., Wang, X., Zhang, H., & Hu, X. (2025, January). An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection. IEEE Access.

Chicago Style (17th ed.) Citation

Li, Mengyun, Xueying Wang, Hongtao Zhang, and Xiaofeng Hu. "An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection." IEEE Access Jan. 2025.

MLA (9th ed.) Citation

Li, Mengyun, et al. "An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection." IEEE Access, Jan. 2025.