APA (7th ed.) Citation

Flynn‐Hepford, M., Lasseter, J., Kravchenko, I., Randolph, S., Keum, J., Sumpter, B. G., . . . Ovchinnikova, O. S. (2024, January). Direct Visualization of Charge Migration in Bilayer Tantalum Oxide Films by Multimodal Imaging. Advanced Electronic Materials.

Chicago Style (17th ed.) Citation

Flynn‐Hepford, Matthew, et al. "Direct Visualization of Charge Migration in Bilayer Tantalum Oxide Films by Multimodal Imaging." Advanced Electronic Materials Jan. 2024.

MLA (9th ed.) Citation

Flynn‐Hepford, Matthew, et al. "Direct Visualization of Charge Migration in Bilayer Tantalum Oxide Films by Multimodal Imaging." Advanced Electronic Materials, Jan. 2024.