Le, T., Adiputra, A. A., Yun, J., & Kim, H. (2025, January). Anomaly Detection in Industrial Machine Sounds Using High-Frequency Features and Gate Recurrent Unit Networks. IEEE Access.
芝加哥风格引文Le, Thi-Thu-Huong, Andro Aprila Adiputra, Jiwon Yun, 与 Howon Kim. "Anomaly Detection in Industrial Machine Sounds Using High-Frequency Features and Gate Recurrent Unit Networks." IEEE Access Jan. 2025.
MLA引文Le, Thi-Thu-Huong, et al. "Anomaly Detection in Industrial Machine Sounds Using High-Frequency Features and Gate Recurrent Unit Networks." IEEE Access, Jan. 2025.
警告：这些引文格式不一定是100％准确.