Multifractal Analysis for Soft Fault Feature Extraction of Nonlinear Analog Circuits

Multifractal Analysis for Soft Fault Feature Extraction of Nonlinear Analog Circuits

Aiming at the nonstationarity and nonlinearity of soft fault signals of nonlinear analog circuits, the use of multifractal detrended fluctuation analysis can effectively reveal the dynamic behavior hidden in multiscale nonstationary signals. This paper adopts a new method that uses multifractal detr...

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Bibliographic Details
Main Authors: Xinmiao Lu, Hong Zhao, Haijun Lin, Qiong Wu
Format: Article
Language:English
Published: Hindawi Limited 2016-01-01
Series:Mathematical Problems in Engineering
Online Access:http://dx.doi.org/10.1155/2016/7305702

Internet

http://dx.doi.org/10.1155/2016/7305702

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