Position-Sensitive Silicon Detector for X-ray Difractometry of Fast Transient Processes
The results of the development and application of position sensitive microdetectors to study dynamics of fast transient processes in metals and alloys under heating/cooling by means of high-speed radiography are presented.
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| Format: | Article |
| Language: | Ukrainian |
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Publishing House "Akademperiodyka"
2014-03-01
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| Series: | Nauka ta Innovacii |
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| Online Access: | ftp://nas.gov.ua/akademperiodyka/Downloads/Archive%20SI%20Journal/SI_ukr/2014/N2/Pugatch.pdf |