Advanced method of global phase shift estimation from two linear carrier interferograms
Abstract Background Phase-shifting interferometry is a kind of important technique used in optical interference metrology. This technique has high precision and good stability, which has been widely used in scientific research and industrial production. Methods This paper proposes a new method to es...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2018-03-01
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| Series: | Journal of the European Optical Society-Rapid Publications |
| Subjects: | |
| Online Access: | http://link.springer.com/article/10.1186/s41476-018-0076-x |