Breakdown behavior of electronics at variable pulse repetition rates
The breakdown behavior of electronics exposed to single transient electromagnetic pulses is subject of investigations for several years. State-of-the-art pulse generators additionally provide the possibility to generate pulse sequences with variable pulse repetition rate. In this article the influen...
| Main Authors: | , |
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| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2006-01-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/4/7/2006/ars-4-7-2006.pdf |