Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging
A real-time study of the dynamic properties of a frequency swept vertical cavity surface emitting laser (VCSEL) is presented. Such tunable laser sources have previously been shown to provide long coherence lengths and improved performance in metrology and imaging applications. Single-shot interferom...
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doaj-eeb74efada284bc59454443687772f7a2021-03-29T17:42:15ZengIEEEIEEE Photonics Journal1943-06552017-01-019511010.1109/JPHOT.2017.27526448038247Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT ImagingT. P. Butler0S. Slepneva1P. M. McNamara2K. Neuhaus3D. Goulding4M. Leahy5G. Huyet6Centre for Advanced Photonics and Process Analysis, Cork Institute of Technology, Cork, IrelandCentre for Advanced Photonics and Process Analysis, Cork Institute of Technology, Cork, IrelandSchool of Physics, National University of Ireland Galway, Galway, IrelandMax Planck Institute of Quantum Optics, Garching, GermanyCentre for Advanced Photonics and Process Analysis, Cork Institute of Technology, Cork, IrelandSchool of Physics, National University of Ireland Galway, Galway, IrelandCentre for Advanced Photonics and Process Analysis, Cork Institute of Technology, Cork, IrelandA real-time study of the dynamic properties of a frequency swept vertical cavity surface emitting laser (VCSEL) is presented. Such tunable laser sources have previously been shown to provide long coherence lengths and improved performance in metrology and imaging applications. Single-shot interferometric reconstruction of both the phase and intensity of the swept source allows for experimental measurement of the full complex electric field over multiple sweep periods. Access to the electric field enables direct measurement of laser properties that can be related to the imaging performance of the laser when used in a swept source optical coherence tomography application. Both inter-sweep and intra-sweep characterization is possible, including determination of the instantaneous spectral shape, sweep rate, linewidth, coherence roll-off, and point spread function.https://ieeexplore.ieee.org/document/8038247/Semiconductor lasersoptical coherence tomography (OCT). |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
T. P. Butler S. Slepneva P. M. McNamara K. Neuhaus D. Goulding M. Leahy G. Huyet |
spellingShingle |
T. P. Butler S. Slepneva P. M. McNamara K. Neuhaus D. Goulding M. Leahy G. Huyet Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging IEEE Photonics Journal Semiconductor lasers optical coherence tomography (OCT). |
author_facet |
T. P. Butler S. Slepneva P. M. McNamara K. Neuhaus D. Goulding M. Leahy G. Huyet |
author_sort |
T. P. Butler |
title |
Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging |
title_short |
Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging |
title_full |
Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging |
title_fullStr |
Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging |
title_full_unstemmed |
Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging |
title_sort |
real-time experimental measurement of swept source vcsel properties relevant to oct imaging |
publisher |
IEEE |
series |
IEEE Photonics Journal |
issn |
1943-0655 |
publishDate |
2017-01-01 |
description |
A real-time study of the dynamic properties of a frequency swept vertical cavity surface emitting laser (VCSEL) is presented. Such tunable laser sources have previously been shown to provide long coherence lengths and improved performance in metrology and imaging applications. Single-shot interferometric reconstruction of both the phase and intensity of the swept source allows for experimental measurement of the full complex electric field over multiple sweep periods. Access to the electric field enables direct measurement of laser properties that can be related to the imaging performance of the laser when used in a swept source optical coherence tomography application. Both inter-sweep and intra-sweep characterization is possible, including determination of the instantaneous spectral shape, sweep rate, linewidth, coherence roll-off, and point spread function. |
topic |
Semiconductor lasers optical coherence tomography (OCT). |
url |
https://ieeexplore.ieee.org/document/8038247/ |
work_keys_str_mv |
AT tpbutler realtimeexperimentalmeasurementofsweptsourcevcselpropertiesrelevanttooctimaging AT sslepneva realtimeexperimentalmeasurementofsweptsourcevcselpropertiesrelevanttooctimaging AT pmmcnamara realtimeexperimentalmeasurementofsweptsourcevcselpropertiesrelevanttooctimaging AT kneuhaus realtimeexperimentalmeasurementofsweptsourcevcselpropertiesrelevanttooctimaging AT dgoulding realtimeexperimentalmeasurementofsweptsourcevcselpropertiesrelevanttooctimaging AT mleahy realtimeexperimentalmeasurementofsweptsourcevcselpropertiesrelevanttooctimaging AT ghuyet realtimeexperimentalmeasurementofsweptsourcevcselpropertiesrelevanttooctimaging |
_version_ |
1724197453820854272 |