Annealing temperature induced improved crystallinity of ysz thin film
Six YSZ thin films (YSZTFs) were prepared at varied annealing temperature (380 °C to 600 °C) by radio frequency magnetron sputtering method. Glancing angle x-ray diffraction (GAXRD) pattern revealed the polycrystalline nature of all films with crystallite size in the range of 9 to 15 nm. Sample anne...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
Institute of Physics Publishing,
2020-05.
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Subjects: | |
Online Access: | Get fulltext |