Study of Electromagnetic Compatibility in Integrated Circuits
碩士 === 國立臺灣科技大學 === 電子工程技術研究所 === 86 === Reliability of VLSI circuits is an important issue in device scaling, especially the noise in mixed-mode MOS VLSI circuits with devices scaleddown into submicrometer and deep submicrometer causes the circuits mal-function. This thesis studies the e...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1998
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| Online Access: | http://ndltd.ncl.edu.tw/handle/57274839679403026102 |