A New Point Source Model for the Three-dimensional Sub-wavelength Rectangular Aperture

碩士 === 國立成功大學 === 物理學系 === 102 === We develop a new point source model to describe the far-field diffraction patterns caused by an electromagnetic wave going through a sub-wavelength rectangular aperture pierced in a perfect electrical conductor (PEC) film. Through the whole process, we hope to unde...

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Bibliographic Details
Main Authors: Feng-TianLin, 林豐田
Other Authors: Kuan-Ren Chen
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/00041687838132449802