On the Applications of Delta Circuit Model for the Analysis of Process Variation and Aging Effects in Analog Circuits
博士 === 國立中央大學 === 電機工程學系 === 106 === As devices continue to shrink, the process variation and aging effects have increasing impacts on the circuit yield and reliability, particularly for analog circuits. If those non-ideal effects can be considered in early design stages, the re-design and re-spin c...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/6s75eg |