Advanced photomask characterisation for microlithography

This thesis addresses the characterisation of these advanced photomasks. There are many techniques published that produce advanced masks, but this work deals with two of the primary ones, advanced binary masks and alternating phase shift masks (altPSM). The work covered studies the methods of extrac...

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Bibliographic Details
Main Author: McCallum, Martin
Published: University of Edinburgh 2006
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.666100