Probabilistic Analysis for Reliable Logic Circuits

Continued aggressive scaling of electronic technology poses obstacles for maintaining circuit reliability. To this end, analysis of reliability is of increasing importance. Large scale number of inputs and gates or correlations of failures render such analysis computationally complex. This paper pre...

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Bibliographic Details
Main Author: Blakely, Scott
Format: Others
Published: PDXScholar 2014
Subjects:
Online Access:https://pdxscholar.library.pdx.edu/open_access_etds/1860
https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=2860&context=open_access_etds