APA (7th ed.) Citation

Bukhori, M., Hatta, S., Hussin, H., & Soin, N. (2015). Impact of different NBTI defect components on sub-threshold operation of high-k p-MOSFET. https://doi.org/10.1088/1757-899X/99/1/012015

Chicago Style (17th ed.) Citation

Bukhori, MF, SWM Hatta, H. Hussin, and N. Soin. Impact of Different NBTI Defect Components on Sub-threshold Operation of High-k P-MOSFET. 2015. https://dx.doi.org/10.1088/1757-899X/99/1/012015.

MLA (8th ed.) Citation

Bukhori, MF, et al. Impact of Different NBTI Defect Components on Sub-threshold Operation of High-k P-MOSFET. 2015.