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Dai, Chia-Tsen
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Ker, Ming-Dou
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Study of Electrostatistic Discharge Protection Design in
High
-
Voltage
BCD Processes
by
Dai, Chia-Tsen
,
戴嘉岑
Published 2012
“
..., the process complexity and the reliability of
high
-
voltage
(HV) devices have become more challenging compared...
”
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Dai, Chia-Tsen
Ker, Ming-Dou
戴嘉岑
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