Search Results - Minki Suh

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  1. 1

    Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation by Jin-Woo Han, Minki Suh, Gyeongyeop Lee, Jungsik Kim

    Published in IEEE Access (2023-01-01)
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  2. 2

    Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects by Minji Bang, Jonghyeon Ha, Gyeongyeop Lee, Minki Suh, Jungsik Kim

    Published in Micromachines (2023-05-01)
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  3. 3

    Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects by Gyeongyeop Lee, Minki Suh, Minsang Ryu, Yunjong Lee, Jin-Woo Han, Jungsik Kim

    Published in IEEE Access (2023-01-01)
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  4. 4

    Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory by Jonghyeon Ha, Minji Bang, Gyeongyeop Lee, Minki Suh, Chong-Eun Kim, Jungsik Kim

    Published in IEEE Access (2023-01-01)
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  5. 5

    Comprehensive Hammering and Parasitic BJT Effects in Vertically Stacked DRAM by Minki Suh, Minsang Ryu, Jonghyeon Ha, Minji Bang, Dabok Lee, Hojoon Lee, Hyunchul Sagong, Jungsik Kim

    Published in IEEE Access (2024-01-01)
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  6. 6

    Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models by Jonghyeon Ha, Sun Jin Kim, Minji Bang, Gyeongyeop Lee, Minki Suh, Minseob Shim, Chong-Eun Kim, Jungsik Kim

    Published in IEEE Access (2023-01-01)
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  7. 7

    Soft Error in Saddle Fin-Based DRAM at Cryogenic Temperature by Minsang Ryu, Minki Suh, Jonghyeon Ha, Minji Bang, Dabok Lee, Hojoon Lee, Hyunchul Sagong, Dong-Seok Kim, Jungsik Kim

    Published in IEEE Access (2025-01-01)
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  8. 8

    Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell by Minji Bang, Jonghyeon Ha, Minki Suh, Dabok Lee, Minsang Ryu, Jin-Woo Han, Hyunchul Sagong, Hojoon Lee, Jungsik Kim

    Published in IEEE Access (2024-01-01)
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  9. 9

    Abnormal Operation of 6-T SRAM Based on Nanosheet FET Due to Total Ionizing Dose by Jonghyeon Ha, Minji Bang, Minki Suh, Dabok Lee, Minsang Ryu, Jin-Woo Han, Hyunchul Sagong, Hojoon Lee, Jungsik Kim

    Published in IEEE Access (2025-01-01)
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