Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel Detector

The precision and accuracy of diffraction measurements with 2D area detectors depends on how well the experimental geometry is known. A method is described to measure the module geometry in order to obtain accurate strain data using a new Eiger2 4M CdTe detector. Smooth Debye–Scherrer powder diffrac...

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Bibliographic Details

Published in:	Crystals
Main Authors:	Jonathan P. Wright, Carlotta Giacobbe, Eleanor Lawrence Bright
Format:	Article
Language:	English
Published:	MDPI AG 2022-02-01
Subjects:	distortion correction pixel detector X-ray diffraction strain
Online Access:	https://www.mdpi.com/2073-4352/12/2/255