Anisotropy engineering using exchange bias on antidot templates

We explore an emerging device concept based on exchange bias used in conjunction with an antidot geometry to fine tune ferromagnetic resonances. Planar cavity ferromagnetic resonance is used to study the microwave response of NiO/NiFe bilayers with antidot structuring. A large frequency asymmetry wi...

詳細記述

書誌詳細
出版年:AIP Advances
主要な著者: F. J. T. Goncalves, R. D. Desautels, S. Su, T. Drysdale, J. van Lierop, K.-W. Lin, D. S. Schmool, R. L. Stamps
フォーマット: 論文
言語:英語
出版事項: AIP Publishing LLC 2015-06-01
オンライン・アクセス:http://dx.doi.org/10.1063/1.4922055