Optimizing Insulated-Gate Bipolar Transistors’ Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests

This paper presents a detailed refinement and validation of two well-known lifetime prediction models for IGBTs, namely CIPS08 and SKiM63, using experimental power cycling test data. This study focuses on adapting these models to reflect the operational conditions and degradation patterns to more ac...

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Bibliographic Details

Published in:	Energies
Main Authors:	Omid Alavi, Ward De Ceuninck, Michaël Daenen
Format:	Article
Language:	English
Published:	MDPI AG 2024-05-01
Subjects:	Bayerer lifetime model Coffin–Manson IGBT lifetime prediction junction temperature Monte Carlo simulations power cycling tests
Online Access:	https://www.mdpi.com/1996-1073/17/11/2616