Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

Dynamic atomic force microscopy (AFM) modes that operate at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types, including biological samples, soft polymers, and hard materials. Th...

詳細記述

書誌詳細

出版年:	Beilstein Journal of Nanotechnology
主要な著者:	Mustafa Kangül, Navid Asmari, Santiago H. Andany, Marcos Penedo, Georg E. Fantner
フォーマット:	論文
言語:	英語
出版事項:	Beilstein-Institut 2024-02-01
主題:	atomic force microscopy (afm) feedback control off-resonance tapping (ort) pulsed-force mode
オンライン･アクセス:	https://doi.org/10.3762/bjnano.15.13