Investigation of proton single-event transient in CMOS image sensor

With the increasingly widespread application of CMOS image sensors (CIS) in radiation environments, such as aerospace, their radiation effects have gained attention. This paper investigates single-event transient (SET) caused by the proton direct ionization on CIS, combining both experimental and si...

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書誌詳細

出版年:	AIP Advances
主要な著者:	Zhigang Peng, Yanjun Fu, Yuan Wei, Yinghong Zuo, Shengli Niu, Jinhui Zhu, Yaxin Guo, Fang Liu, Pei Li, Chaohui He, Yonghong Li
フォーマット:	論文
言語:	英語
出版事項:	AIP Publishing LLC 2024-01-01
オンライン･アクセス:	http://dx.doi.org/10.1063/5.0184659