Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy

A new technique for determining the point spread function, which is required for measuring the surface potential using Kelvin probe microscopy (KPM), is presented. The method involves using a silicon carbide substrate coated with single-layer and bilayer graphene as a test structure and obtaining KP...

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Bibliographic Details

Published in:	C
Main Authors:	Sergey P. Lebedev, Ilya A. Eliseyev, Mikhail S. Dunaevskiy, Ekaterina V. Gushchina, Alexander A. Lebedev
Format:	Article
Language:	English
Published:	MDPI AG 2023-06-01
Subjects:	scanning probe microscopy Kelvin probe microscopy graphene SiC thin films
Online Access:	https://www.mdpi.com/2311-5629/9/3/62