Mineral Characterization Using Scanning Electron Microscopy (SEM): A Review of the Fundamentals, Advancements, and Research Directions

Scanning electron microscopy (SEM) is a powerful tool in the domains of materials science, mining, and geology owing to its enormous potential to provide unique insight into micro and nanoscale worlds. This comprehensive review discusses the background development of SEM, basic SEM operation, includ...

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書誌詳細

出版年:	Applied Sciences
主要な著者:	Asif Ali, Ning Zhang, Rafael M. Santos
フォーマット:	論文
言語:	英語
出版事項:	MDPI AG 2023-11-01
主題:	scanning electron microscopy minerals artificial intelligence machine learning energy-dispersive spectrometer backscattered electron imaging
オンライン･アクセス:	https://www.mdpi.com/2076-3417/13/23/12600