Fault Prediction Modeling for High-Impact Recorders Based on IPSO-SVM

The challenge in reusing high-impact recorders lies in developing an efficient and accurate failure prediction model under small-sample conditions. To address this issue, this study proposes an IPSO-SVM model. First, the particle swarms in the IPSO algorithm were grouped based on their exploration a...

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Bibliographic Details
Published in:Applied Sciences
Main Authors: Linyu Li, Wenbin You, Yonghong Ding
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Subjects:
Online Access:https://www.mdpi.com/2076-3417/15/3/1343