Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as glass, we developed a carry-in diffractometer to utilise X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element-specific analyses with atomic resolution usin...

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Bibliographic Details

Published in:	Journal of Synchrotron Radiation
Main Authors:	Hiroo Tajiri, Shinji Kohara, Koji Kimura, Sekhar Halubai, Haruto Morimoto, Naohisa Happo, Jens R. Stellhorn, Yohei Onodera, Xvsheng Qiao, Daisuke Urushihara, Peidong Hu, Toru Wakihara, Toyohiko Kinoshita, Koichi Hayashi
Format:	Article
Language:	English
Published:	International Union of Crystallography 2025-01-01
Subjects:	x-ray diffractometers x-ray fluorescence holography anomalous x-ray scattering element-specific measurements carry-in equipment
Online Access:	https://journals.iucr.org/paper?S1600577524011366