High-Drain Field Impacting Channel-Length Modulation Effect for Nano-Node N-Channel FinFETs
Three dimensional (3-D) FinFET devices with an ultra-high Si-fin aspect ratio have been developed after integrating a 14Å nitrided gate oxide upon the silicon on insulator (SOI) wafers through an advanced CMOS logic platform. Under the lower gate voltage (<i>V<sub>GS</sub></i>...
| Published in: | Crystals |
|---|---|
| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-03-01
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| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-4352/11/3/262 |