APA引文

Idris, M. I., Yoshida, K., & Yano, T. (2022, March). Radiation damage analysis in SiC microstructure by transmission electron microscopy. Nuclear Engineering and Technology.

Chicago Style (17th ed.) Citation

Idris, Mohd Idzat, Katsumi Yoshida, and Toyohiko Yano. "Radiation Damage Analysis in SiC Microstructure by Transmission Electron Microscopy." Nuclear Engineering and Technology Mar. 2022.

MLA引文

Idris, Mohd Idzat, et al. "Radiation Damage Analysis in SiC Microstructure by Transmission Electron Microscopy." Nuclear Engineering and Technology, Mar. 2022.