THz-TDS Techniques of Thickness Measurements in Thin Shim Stock Films and Composite Materials

Terahertz wave (T-ray) scanning applications are one of the most promising tools for nondestructive evaluation. T-ray scanning applications use a T-ray technique to measure the thickness of both thin Shim stock films and GFRP (glass fiber-reinforced plastics) composites, of which the samples were se...

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Bibliographic Details

Published in:	Applied Sciences
Main Authors:	Kwang-Hee Im, Sun-Kyu Kim, Young-Tae Cho, Yong-Deuck Woo, Chien-Ping Chiou
Format:	Article
Language:	English
Published:	MDPI AG 2021-09-01
Subjects:	terahertz waves refractive index thickness measurement Shim stock films composite materials reflection mode
Online Access:	https://www.mdpi.com/2076-3417/11/19/8889