Damage evolution of Cu-inductors used for electromagnetic forming
Abstract Electromagnetic forming (EMF) is a high-speed forming technology using the interactions of pulsed currents and magnetic fields to apply Lorentz forces to electrically conductive workpieces. The damage behavior of Cu-inductors used for EMF was investigated by electron microscopy, particularl...
| 发表在: | Scientific Reports |
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| Main Authors: | , , , , , |
| 格式: | 文件 |
| 语言: | 英语 |
| 出版: |
Nature Portfolio
2025-08-01
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| 主题: | |
| 在线阅读: | https://doi.org/10.1038/s41598-025-14135-4 |
