Fluence Dependence of Surface Morphology and Deuterium Retention in W Bulks and Nanocrystalline W Films Exposed to Deuterium Plasma

The surface morphology of pure W bulks and nanocrystalline tungsten films was investigated after exposure to a low-energy (100 eV/D), high-flux (1.8 × 10²¹ D·m⁻²s⁻¹) deuterium plasma. Nanocrystalline tungsten films of 6 μm thicknes...

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Bibliographic Details

Published in:	Applied Sciences
Main Authors:	Jing Yan, Xia Li, Kaigui Zhu
Format:	Article
Language:	English
Published:	MDPI AG 2021-02-01
Subjects:	nanocrystalline tungsten films magnetron sputtering deuterium retention
Online Access:	https://www.mdpi.com/2076-3417/11/4/1619