Measuring Complex Refractive Indices of a Nanometer-Thick Superconducting Film Using Terahertz Time-Domain Spectroscopy with a 10 Femtoseconds Pulse Laser

Superconducting thin films are widely applied in various fields, including switching devices, because of their phase transition behaviors in relation to temperature changes. Therefore, it is important to quantitatively determine the optical constant of a superconducting material in the thin-film sta...

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Bibliographic Details

Published in:	Crystals
Main Authors:	Hyoung-Taek Lee, Gang-Seon Ji, Jun-Yung Oh, Choong-Won Seo, Byeong-Won Kang, Kyung-Wan Kim, Hyeong-Ryeol Park
Format:	Article
Language:	English
Published:	MDPI AG 2021-06-01
Subjects:	terahertz time domain spectroscopy complex refractive index thin film characterization superconductor femtosecond laser
Online Access:	https://www.mdpi.com/2073-4352/11/6/651