In situ quantification of fungicide residue on wheat leaf surfaces using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry imaging technology

To overcome the time-consuming off-site limitations in conventional pesticide detection, this contribution presents an in situ quantitative analysis detection strategy for pesticides on leaf surfaces using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry imaging technolog...

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Bibliographic Details

Published in:	Food Chemistry: X
Main Authors:	Xuerui Yang, Mengyao Shi, Minghui Hong, Zhixin Hui, Jiaqi Pan, Guangli Xiu, Lei Zhou
Format:	Article
Language:	English
Published:	Elsevier 2025-01-01
Subjects:	Leaf Matrices Metrafenone Pesticide Sublimation spraying
Online Access:	http://www.sciencedirect.com/science/article/pii/S2590157525000082