Product Inspection Methodology via Deep Learning: An Overview
In this study, we present a framework for product quality inspection based on deep learning techniques. First, we categorize several deep learning models that can be applied to product inspection systems. In addition, we explain the steps for building a deep-learning-based inspection system in detai...
| 出版年: | Sensors |
|---|---|
| 主要な著者: | , , |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
MDPI AG
2021-07-01
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| 主題: | |
| オンライン･アクセス: | https://www.mdpi.com/1424-8220/21/15/5039 |