Sizing of SRAM Cell with Voltage Biasing Techniques for Reliability Enhancement of Memory and PUF Functions

Static Random Access Memory (SRAM) has recently been developed into a physical unclonable function (PUF) for generating chip-unique signatures for hardware cryptography. The most compelling issue in designing a good SRAM-based PUF (SPUF) is that while maximizing the mismatches between the transistor...

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Bibliographic Details

Published in:	Journal of Low Power Electronics and Applications
Main Authors:	Chip-Hong Chang, Chao Qun Liu, Le Zhang, Zhi Hui Kong
Format:	Article
Language:	English
Published:	MDPI AG 2016-08-01
Subjects:	physical unclonable function (PUF) hardware security Static Random Access Memory (SRAM) process variation memory failures
Online Access:	http://www.mdpi.com/2079-9268/6/3/16